Title :
The increase in the in-plane acceleration sensitivity of the plano-convex resonator due to its thickness asymmetry
Author :
Tiersten, H.F. ; Zhou, Y.S.
Author_Institution :
Rensselaer Polytech. Inst., Troy, NY, USA
Abstract :
An analysis of the degradation in the in-plane acceleration sensitivity that arises from the contour being on one side only is performed. Under in-plane acceleration, the single contour causes a state of flexure and asymmetric shear to exist in the resonator plate. The flexural biasing deformation is determined by means of a variational approximation procedure. The shearing stresses varying through the thickness and accompanying strains are determined recursively. The resulting biasing states are employed in the existing perturbation equation along with the equivalent trapped energy mode shapes of the contoured resonators to calculate the degradation in the in-plane acceleration sensitivity caused by the loss of symmetry of the plano-convex resonator. The calculated results show that the in-plane sensitivity increases with decreasing radius of curvature and lies in the range of a few parts in 1012 per g
Keywords :
acceleration; crystal resonators; crystallographic shear; perturbation techniques; sensitivity analysis; stress effects; variational techniques; asymmetric shear; contoured resonators; degradation; flexural biasing deformation; in-plane acceleration sensitivity; perturbation equation; plano-convex resonator; shearing stresses; thickness asymmetry; variational approximation procedure; Acceleration; Aerospace engineering; Capacitive sensors; Degradation; Equations; Mechanical engineering; Performance analysis; Shape; Shearing; Stress;
Conference_Titel :
Frequency Control, 1991., Proceedings of the 45th Annual Symposium on
Conference_Location :
Los Angeles, CA
Print_ISBN :
0-87942-658-6
DOI :
10.1109/FREQ.1991.145914