DocumentCode
3445662
Title
The increase in the in-plane acceleration sensitivity of the plano-convex resonator due to its thickness asymmetry
Author
Tiersten, H.F. ; Zhou, Y.S.
Author_Institution
Rensselaer Polytech. Inst., Troy, NY, USA
fYear
1991
fDate
29-31 May 1991
Firstpage
289
Lastpage
297
Abstract
An analysis of the degradation in the in-plane acceleration sensitivity that arises from the contour being on one side only is performed. Under in-plane acceleration, the single contour causes a state of flexure and asymmetric shear to exist in the resonator plate. The flexural biasing deformation is determined by means of a variational approximation procedure. The shearing stresses varying through the thickness and accompanying strains are determined recursively. The resulting biasing states are employed in the existing perturbation equation along with the equivalent trapped energy mode shapes of the contoured resonators to calculate the degradation in the in-plane acceleration sensitivity caused by the loss of symmetry of the plano-convex resonator. The calculated results show that the in-plane sensitivity increases with decreasing radius of curvature and lies in the range of a few parts in 1012 per g
Keywords
acceleration; crystal resonators; crystallographic shear; perturbation techniques; sensitivity analysis; stress effects; variational techniques; asymmetric shear; contoured resonators; degradation; flexural biasing deformation; in-plane acceleration sensitivity; perturbation equation; plano-convex resonator; shearing stresses; thickness asymmetry; variational approximation procedure; Acceleration; Aerospace engineering; Capacitive sensors; Degradation; Equations; Mechanical engineering; Performance analysis; Shape; Shearing; Stress;
fLanguage
English
Publisher
ieee
Conference_Titel
Frequency Control, 1991., Proceedings of the 45th Annual Symposium on
Conference_Location
Los Angeles, CA
Print_ISBN
0-87942-658-6
Type
conf
DOI
10.1109/FREQ.1991.145914
Filename
145914
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