Yield enhancement for solar cell manufacturing using resonance Ultrasonic vibrations inspection

Author

Belyaev, A. ; Emirov, Yu ; Ostapenko, S. ; Tarasov, I. ; Verstraten, V. ; Van Dooren, M. ; Fumei, P.G. ; Van Veghel, G. ; Bentz, P. ; Van Der Heide, A.

Author_Institution

Ultrasonic Technol. Inc., Tampa, FL, USA

fYear

2009

fDate

7-12 June 2009

Abstract

Resonance Ultrasonic vibrations (RUV) methodology was developed and applied to access mechanical quality of crystalline silicon wafers and solar cells. RUV approach is based on fast non-destructive measurement of specific resonance vibration mode generated in the tested object using external ultrasonic transducer. Crack introduced into the object alters the resonance properties of the mode and allows sensitive diagnostics of the crack appearance. The paper describes our recent results of applying RUV method at industrial environment with objective to reduce a breakage rate in solar cell and solar module lines.

Keywords

electrical products industry; inspection; solar cells; ultrasonic materials testing; ultrasonic transducers; breakage rate; crack appearance; crystalline silicon wafers; fast nondestructive measurement; mechanical quality; resonance properties; resonance ultrasonic vibrations inspection; resonance vibration mode; solar cell manufacturing; solar module lines; ultrasonic transducer; yield enhancement; Crystallization; Inspection; Manufacturing; Nondestructive testing; Photovoltaic cells; Resonance; Silicon; Solar power generation; Ultrasonic variables measurement; Vibration measurement;

fLanguage

English

Publisher

ieee

Conference_Titel

Photovoltaic Specialists Conference (PVSC), 2009 34th IEEE

Conference_Location

Philadelphia, PA

ISSN

0160-8371

Print_ISBN

978-1-4244-2949-3

Electronic_ISBN

0160-8371

Type

conf

DOI

10.1109/PVSC.2009.5411565

Filename

5411565