• DocumentCode
    3446481
  • Title

    NRC Quantum Hall Devices for National Measurement Institutes

  • Author

    Inglis, A.D.

  • Author_Institution
    Inst. for Nat. Meas. Stand., National Res. Council, Ottawa, Ont.
  • fYear
    2004
  • fDate
    38139
  • Firstpage
    275
  • Lastpage
    276
  • Abstract
    At CPEM´02 in Ottawa the NRC Electrical Standards Group undertook to fabricate a batch of Hall devices suitable for use at National Measurement Institutes as resistance standards. One wafer has been fabricated to date and testing of the electrical parameters of devices has commenced. The paper described the fabrication parameters, and preliminary test results
  • Keywords
    Hall effect devices; electric resistance measurement; measurement standards; NRC; National Measurement Institutes; National Research Council; quantum Hall devices; resistance standards; Annealing; Councils; Electric resistance; Electrical resistance measurement; Fabrication; Gallium arsenide; Large-scale systems; Measurement standards; Molecular beam epitaxial growth; Testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Precision Electromagnetic Measurements Digest, 2004 Conference on
  • Conference_Location
    London
  • Print_ISBN
    0-7803-8494-6
  • Electronic_ISBN
    0-7803-8494-6
  • Type

    conf

  • DOI
    10.1109/CPEM.2004.305570
  • Filename
    4097225