Foreword

This is the Final Report ofthe IEEE International Reliability Workshop 2005 (IIRW - please note that we extended the acronym for better association with our new web address). This year\´s workshop was the best attended so far in this millennium, suggesting that IIRW remains a unique and effective venue for lively interaction among reliability professionals facing the rapidly changing challenges of our business. My thanks to all who made this year such a great experience: the attendees from all over the world with their presentations and questions, the Technical Program Committee for selecting the papers from the large number ofsubmissions and mentoring them, and last but not least the Management Committee, including our consultants, who worked dedicatedly year round on preparing and organizing the workshop. I have enjoyed working with all of you and have had lots of fun including receiving the "pink slip" for the General Chair in the form of the pink-shirt surprise.