DocumentCode :
3446730
Title :
Evaluations of the printing qualities of RFID tag´s conducting line
Author :
Yanfang Xu ; Luhai Li ; Yingkun Ding ; Wenbo Li
Author_Institution :
Sch. of Printing & Packaging Eng., Beijing Inst. of Graphic Commun., Beijing, China
fYear :
2012
fDate :
16-18 Oct. 2012
Firstpage :
1245
Lastpage :
1248
Abstract :
The printing quality of RFID tag conducting line will influence its electric properties. In this paper, utilizing digital image process techniques, a method for measuring the printed width of the conducting line of RFID tag, and the raggedness and the blurriness of the line´s edges was represented. Firstly, a CCD image capture system was selected, and the relationship between its respond RGB values and their corresponding light reflectivity was built. Secondly, the conducting line image captured by the CCD system was transformed into a reflectivity gray image by the relationship. Finally, utilizing a series of image processing procedures, such as orientation aligning, characteristic gray point extraction, linear fitting, and error calculation, three quality parameters, which are line width, raggedness and blurriness, were obtained. Our experiments on three RFID tag products showed that the method can measure the three printing quality parameters conveniently and quickly, giving their printing quality representations and comparisons.
Keywords :
CCD image sensors; image colour analysis; image representation; printing; radiofrequency identification; reflectivity; CCD image capture system; RFID tag conducting line; RGB values; conducting line image capturing; digital image process techniques; electric properties; image processing procedures; light reflectivity; line edges blurriness; line edges raggedness; printed width; printing quality representations; reflectivity gray image; three printing quality parameters; Charge coupled devices; Digital images; Optical imaging; Optical reflection; Printing; Radiofrequency identification; Reflectivity; RFID tag; blurriness; conducting line; line width; raggedness;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Image and Signal Processing (CISP), 2012 5th International Congress on
Conference_Location :
Chongqing
Print_ISBN :
978-1-4673-0965-3
Type :
conf
DOI :
10.1109/CISP.2012.6469879
Filename :
6469879
Link To Document :
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