• DocumentCode
    3446732
  • Title

    Optical and electrical properties of ZnO thin films synthesized by sol-gel method for the application in three-dimensional junction photovoltaics

  • Author

    Jun, Woosuk ; Kim, Hong Tak ; Kim, Dongwook ; Park, Chinho

  • Author_Institution
    Sch. of Display & Chem. Eng., Yeungnam Univ., Gyeongsan, South Korea
  • fYear
    2009
  • fDate
    7-12 June 2009
  • Abstract
    In this study, we investigated the properties of ZnO nanostructures grown by a sol-gel method on glass substrates. First, the seed layer of ZnO were formed using zinc acetate dihydrate (Zn(CH3COOH)2·2H2O), 2-propanol (CH3CH2 CH2OH), and sodium hydroxide (NaOH) as precursor material, solvent and sol stabilizer, respectively. The three dimensional ZnO nanostructures were then grown by the CBD(Chemical Bath Deposition) process. The solution was composed of zinc nitrate hexahydrate (Zn(NO3)2·6H2O) and hexamine (C6H12N4). The properties of ZnO nanostructures were investigated by SEM, XRD, and UV-Vis-NIR. We found that the growth temperature and seed layer structure are important factors in controlling the structures of ZnO formed.
  • Keywords
    II-VI semiconductors; X-ray diffraction; nanostructured materials; scanning electron microscopy; semiconductor thin films; sol-gel processing; solar cells; zinc compounds; 2-propanol; 3D junction photovoltaics; UV-vis-NIR; X-ray diffraction; ZnO; ZnO nanostructures; chemical bath deposition process; electrical properties; glass substrates; growth temperature; hexamine; optical properties; precursor material; scanning electron microscopy; seed layer; sodium hydroxide; sol stabilizer; sol-gel method; solvent; thin films; zinc acetate dihydrate; zinc nitrate hexahydrate; Glass; Nanostructures; Optical films; Optical scattering; Optical sensors; Photonic band gap; Photovoltaic cells; Scanning electron microscopy; X-ray scattering; Zinc oxide;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Photovoltaic Specialists Conference (PVSC), 2009 34th IEEE
  • Conference_Location
    Philadelphia, PA
  • ISSN
    0160-8371
  • Print_ISBN
    978-1-4244-2949-3
  • Electronic_ISBN
    0160-8371
  • Type

    conf

  • DOI
    10.1109/PVSC.2009.5411605
  • Filename
    5411605