Improving design dependability based on the TRON loose standardization approach

We have been exploring means of improving design dependability based on the TRON loose standardization approach. Our study ranges from design fault tolerance to design fault avoidance. With regard to design fault tolerance, we have been developing an MLDD (Multi-Layered Design Diversity) architecture that adopts design diversity at an application program layer, an operating system layer, and a hardware layer. It is noteworthy that a standardization project in which multiple manufacturers independently develop implementations from one predefined interface specification is equal to design diversity, which is widely used in a number of critical systems to provide design fault tolerance. With regard to design fault avoidance, we have developed a test generation method that first derives tests from a specification, adapting them to the internal structure of each implementation. This paper describes these methods, focusing on, how they take advantage of the TRON loose standardization