DocumentCode
3447162
Title
Discussion Group Summary Building In Reliability
Author
Prendergast, James ; Steeves, John
Author_Institution
Analog Devices Inc.
fYear
1996
fDate
20-23 Oct. 1996
Firstpage
161
Lastpage
162
Keywords
Circuit testing; Costs; Electromigration; Electronics industry; Fabrication; Integrated circuit reliability; Life testing; Manufacturing processes; Personnel; Reliability engineering;
fLanguage
English
Publisher
ieee
Conference_Titel
Integrated Reliability Workshop, 1996., IEEE International
Conference_Location
Lake Tahoe, CA, USA
Print_ISBN
0-7803-3598-8
Type
conf
DOI
10.1109/IRWS.1996.583402
Filename
583402
Link To Document