DocumentCode :
3447400
Title :
MEMS reliability
Author :
Tanner, D.
Author_Institution :
Sandia National Labs
fYear :
2005
fDate :
17-20 Oct. 2005
Abstract :
Summary form only given. The main thrust in any reliability work is identifying for the new technology of microelectromechanical systems (MEMS). This tutorial includes a brief review of MEMS fabrication methods and identifies some commercial products. We describe some of the methods developed to measure materials parameters and surface properties to characterize MEMS devices. Our reliability methodology employs statistical characterization and testing to help us identify dominant failure modes. We strive to determine the root cause of each failure mode and to gain a fundamental (science-based) understanding of that mechanism. The development of predictive models follows from this science-based understanding. A reliability model for wear in a MEMS application with contacting surfaces was presented.
Keywords :
failure analysis; micromechanical devices; statistical analysis; MEMS devices; MEMS fabrication methods; MEMS reliability; failure modes; materials parameters; microelectromechanical systems; statistical characterization; statistical testing; surface properties; Microelectromechanical devices; Micromechanical devices;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Integrated Reliability Workshop Final Report, 2005 IEEE International
Print_ISBN :
0-7803-8992-1
Type :
conf
DOI :
10.1109/IRWS.2005.1609587
Filename :
1609587
Link To Document :
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