• DocumentCode
    3447488
  • Title

    Sampling Capabilities of a DMM - Determination of Key Parameters

  • Author

    Hlupic, N. ; Butorac, J.

  • Author_Institution
    Fac. of Elecrical Eng. & Comput., Zagreb
  • fYear
    2004
  • fDate
    38139
  • Firstpage
    366
  • Lastpage
    367
  • Abstract
    A sampling method for indirect measurement of all relevant parameters of sampling device is presented. One can determine sampling frequency inaccuracy, integration interval inaccuracy and latency time. All these parameters can be determined with relative error less than 10 ppm, except latency time whose absolute accuracy is about 60 ns
  • Keywords
    digital multimeters; measurement uncertainty; sampling methods; DMM; absolute accuracy; indirect measurement; integration interval inaccuracy; latency time; sampling capabilities; sampling frequency inaccuracy; Circuits; Delay effects; Frequency; Instruments; Joining processes; Laboratories; Mirrors; Production facilities; Sampling methods; Time measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Precision Electromagnetic Measurements Digest, 2004 Conference on
  • Conference_Location
    London
  • Print_ISBN
    0-7803-8494-6
  • Electronic_ISBN
    0-7803-8494-6
  • Type

    conf

  • DOI
    10.1109/CPEM.2004.305617
  • Filename
    4097272
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3447488