DocumentCode :
3447789
Title :
InGaAsNSb: a novel material for long-wavelength semiconductor lasers
Author :
Yang, X. ; Heroux, J.B. ; Wang, W.I.
Author_Institution :
Dept. of Electr. Eng., Columbia Univ., New York, NY, USA
fYear :
2001
fDate :
11-11 May 2001
Firstpage :
210
Abstract :
Summary form only given. InGaAsNSb/GaAs QWs were grown by solid-source molecular beam epitaxy using a N/sub 2/ radio frequency (RF) plasma source. X-ray diffraction (XRD), reflection high-energy electron diffraction (RHEED), and transmission electron microscopy (TEM) studies indicate that Sb suppresses the three dimensional growth and improves the interface of the QWs, acting as a surfactant. Sb incorporation was also investigated by secondary ion mass spectroscpy (SIMS). A 1.53 /spl mu/m photoluminescence was obtained from InGaAsNSb/GaAs multiple quantum wells (MQW) at room temperature, which demonstrates the feasibility of InGaAsNSb for 1.55 /spl mu/m lasers. InGaAsNSb/GaAs QW broad area lasers were fabricated to study the effect of adding Sb on the laser performance.
Keywords :
III-V semiconductors; X-ray diffraction; gallium arsenide; indium compounds; molecular beam epitaxial growth; photoluminescence; quantum well lasers; reflection high energy electron diffraction; semiconductor quantum wells; transmission electron microscopy; 1.53 micron; 1.55 micron; InGaAsNSb; InGaAsNSb 1.55 /spl mu/m laser; InGaAsNSb-GaAs; InGaAsNSb/GaAs QWs; InGaAsNSb/GaAs multiple quantum wells; N/sub 2/; PL peak wavelength; QW broad area lasers; RF) plasma source; RHEED; Sb flux; TEM; X-ray diffraction; photoluminescence; photoluminescence efficiency; red shift; reflection high-energy electron diffraction; secondary ion mass spectroscopy; solid source molecular beam epitaxy; transmission electron microscopy; Electrons; Gallium arsenide; Molecular beam epitaxial growth; Optical reflection; Plasma sources; Quantum well lasers; Radio frequency; Semiconductor materials; X-ray diffraction; X-ray scattering;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Lasers and Electro-Optics, 2001. CLEO '01. Technical Digest. Summaries of papers presented at the Conference on
Conference_Location :
Baltimore, MD, USA
Print_ISBN :
1-55752-662-1
Type :
conf
DOI :
10.1109/CLEO.2001.947715
Filename :
947715
Link To Document :
بازگشت