• DocumentCode
    3447962
  • Title

    Three-dimensional image processing for acoustic microscopy

  • Author

    Reinholdsten, P.A. ; Khuri-Yakub, B.T.

  • Author_Institution
    Stanford Univ., CA, USA
  • fYear
    1988
  • fDate
    2-5 Oct 1988
  • Firstpage
    757
  • Abstract
    The authors have built a scanning acoustic microscope operating in the 3- to 10-MHz range that measures both amplitude and phase. Using the additional information available with an acoustic microscope that measures phase as well as amplitude allows image processing that cannot be done with amplitude alone. The effective resolution can be increased in the transverse resolution and doubled in the vertical direction by Fourier deconvolution of experimental images taken at a single frequency. By combining images taken at closely-spaced frequencies, a significant further increase in effective depth resolution can be obtained. These techniques were applied to images of a deep trench designed as a scale model of vertical capacitors in integrated circuits. The effects of the surface on the overall image can be removed, leaving only the image of the bottom of the trench. The reflection from the top surface of a block of aluminium was numerically removed, providing better contrast of substrate defects
  • Keywords
    acoustic microscopy; acoustic signal processing; 3 to 10 MHz; Fourier deconvolution; acoustic microscopy; amplitude; deep trench; depth resolution; image processing; integrated circuits; phase; substrate defects; transverse resolution; vertical capacitors; Acoustic measurements; Capacitors; Deconvolution; Frequency; Image processing; Image resolution; Integrated circuit modeling; Microscopy; Phase measurement; Reflection;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Ultrasonics Symposium, 1988. Proceedings., IEEE 1988
  • Conference_Location
    Chicago, IL
  • Type

    conf

  • DOI
    10.1109/ULTSYM.1988.49479
  • Filename
    49479