Title :
Automatic path test data generation based on GA-PSO
Author :
Zhang, Sheng ; Zhang, Ying ; Zhou, Hong ; He, Qingquan
Author_Institution :
Sch. of Inf. Eng., Nanchang Hangkong Univ., Nanchang, China
Abstract :
Automatic test data generation is a key issue to achieve test automation. The path test data generation is a hot point in the research field of software test investigation. The previous approaches of generating test data are mostly based on Genetic Algorithms (GA) and its improved algorithm. These approaches have tow shortcomings: one is too complex to use and difficult to set parameters. The other is weak local search and slow convergence. We propose a hybrid algorithm (GA-PSO) which combines Genetic Algorithm and Particle Swarm Optimization (PSO) in this paper. The new algorithm is proved effective by a representative test of the “triangle type of discrimination”. The experiment shows that the new algorithm has higher performance when the value of Φ is 20%.
Keywords :
automatic testing; genetic algorithms; particle swarm optimisation; program testing; GA-PSO; automatic path test data generation; genetic algorithms; particle swarm optimization; software testing; test automation; Gallium; Security; GA-PSO Algorithm; Genetic Algorithm; Particle Swarm Optimization; test data generation;
Conference_Titel :
Intelligent Computing and Intelligent Systems (ICIS), 2010 IEEE International Conference on
Conference_Location :
Xiamen
Print_ISBN :
978-1-4244-6582-8
DOI :
10.1109/ICICISYS.2010.5658735