• DocumentCode
    3448697
  • Title

    Nucleation and early stage growth of CdTe thin films deposited by close space sublimation

  • Author

    Major, J.D. ; Durose, K.

  • Author_Institution
    Dept. of Phys., Univ. of Durham, Durham, UK
  • fYear
    2009
  • fDate
    7-12 June 2009
  • Abstract
    The early stage growth mechanisms of sublimation-grown thin-film polycrystalline CdTe are evaluated by growth interrupts and ex-situ AFM for growth under 100 torr of inert gas. Development of island size, density and coverage demonstrates that growth proceeds via the process of island nucleation, island growth and density increase, followed by coalescence, channel formation and secondary nucleation. Addition of material to the islands occurs partly by the `step-flow´ mechanism. Application of the nucleation model to influence the growth of solar cell quality CdTe layers is demonstrated by the use of elevated gas pressures to increase grain size. The enhanced grain size is attributed to a reduction in nucleation density arising from a decrease in surface concentration of the deposited species.
  • Keywords
    II-VI semiconductors; atomic force microscopy; cadmium compounds; grain size; island structure; nucleation; semiconductor growth; sublimation; vacuum deposited coatings; vacuum deposition; CdTe; close space sublimation; deposited species surface concentration; ex-situ AFM; grain size; island density; island growth; island nucleation; nucleation density; polycrystalline thin film; pressure 100 torr; solar cell; step-flow mechanism; Cascading style sheets; Epitaxial growth; Grain boundaries; Grain size; Nitrogen; Photovoltaic cells; Scanning electron microscopy; Semiconductor films; Semiconductor thin films; Sputtering;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Photovoltaic Specialists Conference (PVSC), 2009 34th IEEE
  • Conference_Location
    Philadelphia, PA
  • ISSN
    0160-8371
  • Print_ISBN
    978-1-4244-2949-3
  • Electronic_ISBN
    0160-8371
  • Type

    conf

  • DOI
    10.1109/PVSC.2009.5411691
  • Filename
    5411691