DocumentCode :
3448702
Title :
Strong emission from selectively-grown GaN quantum dots
Author :
Tachibana, K. ; Miyamura, M. ; Someya, T. ; Ishida, S. ; Arakawa, Y.
Author_Institution :
Res. Center for & Adv. Sci. & Technol., Univ. of Tokyo, Japan
fYear :
2001
fDate :
11-11 May 2001
Firstpage :
240
Lastpage :
241
Abstract :
Summary form only given. GaN-based quantum dots (QDs) have attracted much attention because the lasers with GaN-based QDs embedded in the active layer have lower threshold currents and narrower emission spectra at shorter wavelengths. In this paper, we demonstrate the fabrication and optical properties of selectively-grown GaN QDs for the first time. The photoluminescence (PL) was investigated from 5 to 300 K. The observation of high intensity PL from GaN QDs at room temperature indicates the strong confinement of carriers in the QDs.
Keywords :
III-V semiconductors; MOCVD; gallium compounds; photoluminescence; semiconductor quantum dots; 5 to 300 K; GaN; GaN QDs; GaN quantum dots; active layer; narrower emission spectra; optical properties; photoluminescence; selectively-grown; strong emission; threshold currents; Capacitive sensors; Doping; Gallium nitride; Permittivity; Polarization; Quantum dot lasers; Quantum dots; Quantum well lasers; Tensile stress; US Department of Transportation;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Lasers and Electro-Optics, 2001. CLEO '01. Technical Digest. Summaries of papers presented at the Conference on
Conference_Location :
Baltimore, MD, USA
Print_ISBN :
1-55752-662-1
Type :
conf
DOI :
10.1109/CLEO.2001.947756
Filename :
947756
Link To Document :
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