Improved procedures for testing analog and mixed-signal systems using a microcontroller

Author

Hntzopoulos, A.A. ; Stfniadis, A.

Author_Institution

Dept. of Electr. & Comput. Eng., Aristotelian Univ. of Thessaloniki

Volume

3

fYear

1999

fDate

1999

Firstpage

1651

Abstract

Testing and diagnosis of analog and mixed-signal systems has received considerable attention in the last two decades and many theoretical approaches have been proposed. In this paper, an improvement of an earlier proposed scheme for the implementation of correlation-based comparison for testing analog signatures under the control of a microcontroller is described. The improved scheme may be included in any analog or mixed-signal system and may check its responses at selected test points. Demonstrative results from the application of the testing structure are given, showing its effectiveness and its convenient use

Keywords

built-in self test; correlation methods; fault diagnosis; integrated circuit testing; mixed analogue-digital integrated circuits; BIST; IC testing; analog signatures; correlation-based comparison; diagnosis; microcontroller application; mixed-signal systems; selected test points; testing structure; Automatic testing; Built-in self-test; Circuit testing; Costs; EPROM; Electronic equipment testing; Frequency conversion; Microcontrollers; Sampling methods; System testing;

fLanguage

English

Publisher

ieee

Conference_Titel

Electronics, Circuits and Systems, 1999. Proceedings of ICECS '99. The 6th IEEE International Conference on

Conference_Location

Pafos

Print_ISBN

0-7803-5682-9

Type

conf

DOI

10.1109/ICECS.1999.814491

Filename

814491