Title :
Settling Times of High-Value Standard Resistors
Author :
Jarrett, D.G. ; Elmquist, R.E.
Author_Institution :
National Inst. of Stand. & Technol., Gaithersburg, MD
Abstract :
An investigation of the response of high-value resistance standards and elements to applied potential has shown that the processes used to prepare and construct high-value resistance standards can affect the settling times of these standards. Improvements made to the processes used at NIST to fabricate high-value resistance standards will be discussed
Keywords :
electric resistance; resistors; NIST; high-value resistance standards; high-value standard resistors; Bridge circuits; Calibration; Current measurement; Electrical resistance measurement; Immune system; Measurement standards; NIST; Resistors; Standards development; Wire;
Conference_Titel :
Precision Electromagnetic Measurements Digest, 2004 Conference on
Conference_Location :
London
Print_ISBN :
0-7803-8494-6
Electronic_ISBN :
0-7803-8494-6
DOI :
10.1109/CPEM.2004.305342
