• DocumentCode
    3449077
  • Title

    Settling Times of High-Value Standard Resistors

  • Author

    Jarrett, D.G. ; Elmquist, R.E.

  • Author_Institution
    National Inst. of Stand. & Technol., Gaithersburg, MD
  • fYear
    2004
  • fDate
    38139
  • Firstpage
    522
  • Lastpage
    523
  • Abstract
    An investigation of the response of high-value resistance standards and elements to applied potential has shown that the processes used to prepare and construct high-value resistance standards can affect the settling times of these standards. Improvements made to the processes used at NIST to fabricate high-value resistance standards will be discussed
  • Keywords
    electric resistance; resistors; NIST; high-value resistance standards; high-value standard resistors; Bridge circuits; Calibration; Current measurement; Electrical resistance measurement; Immune system; Measurement standards; NIST; Resistors; Standards development; Wire;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Precision Electromagnetic Measurements Digest, 2004 Conference on
  • Conference_Location
    London
  • Print_ISBN
    0-7803-8494-6
  • Electronic_ISBN
    0-7803-8494-6
  • Type

    conf

  • DOI
    10.1109/CPEM.2004.305342
  • Filename
    4097353
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3449077