DocumentCode
3449110
Title
Effect of barrier thickness on strain balanced InAs/GaAs QD solar cells
Author
Bailey, Christopher G. ; Hubbard, Seth M. ; Forbes, David V. ; Aguinaldo, Ryan ; Cress, Cory D. ; Polly, Stephen J. ; Raffaelle, Ryne P.
Author_Institution
NanoPower Res. Labs., Rochester Inst. of Technol., Rochester, NY, USA
fYear
2009
fDate
7-12 June 2009
Abstract
The effect of the thickness of the barrier layers between quantum dots (QD) in a vertically stacked QD array has been studied using both simulation and experimental techniques. Silvaco ATLAS is used to model how QW barrier thickness affects the onset of confined electron wavefunction overlap. This indicates that barrier thicknesses of less than 8 nm provide miniband formation between wells. P-i-n devices with a strain balanced QD/barrier superlattice embedded i-region were grown epitaxially with varying barrier thicknesses. Electroluminescence measurements were performed on the samples and the energy levels were determined. An overall redshift was observed as the barrier thickness between QD layers was decreased. This correlates well with the current understanding and recent modeling of these systems.
Keywords
III-V semiconductors; electroluminescence; gallium arsenide; indium compounds; red shift; semiconductor quantum dots; semiconductor superlattices; solar cells; wave functions; InAs-GaAs; Silvaco ATLAS; barrier layers; barrier thickness; confined electron wavefunction overlap; electroluminescence; energy levels; p-i-n devices; quantum dots; redshift; strain balanced QD solar cells; strain balanced superlattice embedded i-region; vertically stacked QD array; Capacitive sensors; Electroluminescence; Electrons; Energy measurement; Gallium arsenide; PIN photodiodes; Photovoltaic cells; Quantum dots; Semiconductor process modeling; Superlattices;
fLanguage
English
Publisher
ieee
Conference_Titel
Photovoltaic Specialists Conference (PVSC), 2009 34th IEEE
Conference_Location
Philadelphia, PA
ISSN
0160-8371
Print_ISBN
978-1-4244-2949-3
Electronic_ISBN
0160-8371
Type
conf
DOI
10.1109/PVSC.2009.5411710
Filename
5411710
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