• DocumentCode
    3449110
  • Title

    Effect of barrier thickness on strain balanced InAs/GaAs QD solar cells

  • Author

    Bailey, Christopher G. ; Hubbard, Seth M. ; Forbes, David V. ; Aguinaldo, Ryan ; Cress, Cory D. ; Polly, Stephen J. ; Raffaelle, Ryne P.

  • Author_Institution
    NanoPower Res. Labs., Rochester Inst. of Technol., Rochester, NY, USA
  • fYear
    2009
  • fDate
    7-12 June 2009
  • Abstract
    The effect of the thickness of the barrier layers between quantum dots (QD) in a vertically stacked QD array has been studied using both simulation and experimental techniques. Silvaco ATLAS is used to model how QW barrier thickness affects the onset of confined electron wavefunction overlap. This indicates that barrier thicknesses of less than 8 nm provide miniband formation between wells. P-i-n devices with a strain balanced QD/barrier superlattice embedded i-region were grown epitaxially with varying barrier thicknesses. Electroluminescence measurements were performed on the samples and the energy levels were determined. An overall redshift was observed as the barrier thickness between QD layers was decreased. This correlates well with the current understanding and recent modeling of these systems.
  • Keywords
    III-V semiconductors; electroluminescence; gallium arsenide; indium compounds; red shift; semiconductor quantum dots; semiconductor superlattices; solar cells; wave functions; InAs-GaAs; Silvaco ATLAS; barrier layers; barrier thickness; confined electron wavefunction overlap; electroluminescence; energy levels; p-i-n devices; quantum dots; redshift; strain balanced QD solar cells; strain balanced superlattice embedded i-region; vertically stacked QD array; Capacitive sensors; Electroluminescence; Electrons; Energy measurement; Gallium arsenide; PIN photodiodes; Photovoltaic cells; Quantum dots; Semiconductor process modeling; Superlattices;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Photovoltaic Specialists Conference (PVSC), 2009 34th IEEE
  • Conference_Location
    Philadelphia, PA
  • ISSN
    0160-8371
  • Print_ISBN
    978-1-4244-2949-3
  • Electronic_ISBN
    0160-8371
  • Type

    conf

  • DOI
    10.1109/PVSC.2009.5411710
  • Filename
    5411710