• DocumentCode
    3449188
  • Title

    Si solar microcells for modules with reduced purity requirements, high voltage outputs and mechanically stretchable designs

  • Author

    Baca, Alfred J. ; Yu, Ki Jun ; Cain, Tyler A. ; Kim, Dae Hyeong ; Yoon, Jongseung ; Rockett, Angus A. ; Nuzzo, Ralph G. ; Rogers, John A.

  • Author_Institution
    Depts. of Chem. & Mater. Sci. & Eng., Univ. of Illinois at Urbana Champaign, Urbana, IL, USA
  • fYear
    2009
  • fDate
    7-12 June 2009
  • Abstract
    We recently reported a strategy, in which modules consist of large-scale arrays of small, interconnected ultrathin (i.e. 1-20 ¿m) Si microcells (¿-cells) formed by anisotropic etching of bulk wafers and integrated with a soft printing technique. Here we report three new advances in this type of printed, ¿-cell technology. First, we show that ¿-cells formed with low purity, solar grade wafers (Dow Corning® 101 SOG Si metal), can achieve efficiencies much higher than those possible with corresponding bulk cells formed with the same material. Second, we demonstrate high voltage mini-modules that incorporate these ¿-cells and lead to high voltage outputs. Finally, we demonstrate the fabrication of mechanically stretchable solar cell modules which are non-coplanar (i.e. arch shaped). The results show that these materials and designs yield a stretchable layout that can undergo strains of up to 30% without failure.
  • Keywords
    elemental semiconductors; etching; modules; silicon; solar cell arrays; Dow Corning 101 SOG silicon metal; Si; anisotropic etching; bulk wafers; high-voltage output; interconnected ultrathin microcells; large-scale arrays; mechanical-stretchable design; modules; soft printing technique; solar grade wafers; solar microcells; Anisotropic magnetoresistance; Capacitive sensors; Etching; Fabrication; Inorganic materials; Large scale integration; Microcell networks; Photovoltaic cells; Printing; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Photovoltaic Specialists Conference (PVSC), 2009 34th IEEE
  • Conference_Location
    Philadelphia, PA
  • ISSN
    0160-8371
  • Print_ISBN
    978-1-4244-2949-3
  • Electronic_ISBN
    0160-8371
  • Type

    conf

  • DOI
    10.1109/PVSC.2009.5411715
  • Filename
    5411715