DocumentCode :
3449211
Title :
Optical characterization of CV10-2568 RTV effluent
Author :
Ianno, N.J. ; Pu, J.
Author_Institution :
Dept. of Electr. Eng., Univ. of Nebraska - Lincoln, Lincoln, NE, USA
fYear :
2009
fDate :
7-12 June 2009
Abstract :
In the presence of sunlight, Volatile Condensable Material (VCM) emitted from commonly used room temperature vulcanizing (RTV) material can photochemically deposit onto optically-sensitive spacecraft surfaces and significantly alter their original, beginning-of-life (BOL) optical properties, such as solar absorptance and emittance, causing un-intended performance loss of the spacecraft. We have employed in-situ spectroscopic ellipsometry to monitor in real time the condensed and photofixed effluent of RTV CV10-2568. This technique is sensitive to nm thick layers and can be used to extract n and k as a function of wavelength.
Keywords :
aerospace instrumentation; effluents; ellipsometry; organic compounds; space vehicles; RTV CV10-2568; beginning-of-life optical properties; in-situ spectroscopic ellipsometry; optically-sensitive spacecraft surfaces; performance loss; photochemical deposition; photofixed effluent; room temperature vulcanizing material; solar absorptance; solar emittance; sunlight; volatile condensable material; Aircraft manufacture; Effluents; Optical losses; Optical materials; Optical sensors; Optical surface waves; Performance loss; Photochemistry; Stimulated emission; Temperature;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Photovoltaic Specialists Conference (PVSC), 2009 34th IEEE
Conference_Location :
Philadelphia, PA
ISSN :
0160-8371
Print_ISBN :
978-1-4244-2949-3
Electronic_ISBN :
0160-8371
Type :
conf
DOI :
10.1109/PVSC.2009.5411718
Filename :
5411718
Link To Document :
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