Title :
Aperture jitter effects in wideband ADC systems
Author :
Kobayashi, Haruo ; Morimura, Masanao ; Kobayashi, Kensuke ; Onaya, Yoshitaka
Author_Institution :
Dept. of Electron. Eng., Gunma Univ., Japan
Abstract :
This paper describes the exact formula of the output noise power for almost any input signal in wideband sampling systems in the presence of aperture jitter. Also the finite aperture time effects and the timing skew problem in the interleaved ADC system are discussed. These results are useful for wideband sampling system applications
Keywords :
analogue-digital conversion; jitter; signal sampling; timing; aperture jitter effects; finite aperture time effects; input signal; interleaved ADC system; output noise power; timing skew problem; wideband ADC systems; wideband sampling systems; Apertures; Clocks; Frequency; Jitter; Oscilloscopes; Phase noise; Power engineering and energy; Sampling methods; Signal to noise ratio; Wideband;
Conference_Titel :
Electronics, Circuits and Systems, 1999. Proceedings of ICECS '99. The 6th IEEE International Conference on
Conference_Location :
Pafos
Print_ISBN :
0-7803-5682-9
DOI :
10.1109/ICECS.1999.814504
