DocumentCode
3449244
Title
Aperture jitter effects in wideband ADC systems
Author
Kobayashi, Haruo ; Morimura, Masanao ; Kobayashi, Kensuke ; Onaya, Yoshitaka
Author_Institution
Dept. of Electron. Eng., Gunma Univ., Japan
Volume
3
fYear
1999
fDate
1999
Firstpage
1705
Abstract
This paper describes the exact formula of the output noise power for almost any input signal in wideband sampling systems in the presence of aperture jitter. Also the finite aperture time effects and the timing skew problem in the interleaved ADC system are discussed. These results are useful for wideband sampling system applications
Keywords
analogue-digital conversion; jitter; signal sampling; timing; aperture jitter effects; finite aperture time effects; input signal; interleaved ADC system; output noise power; timing skew problem; wideband ADC systems; wideband sampling systems; Apertures; Clocks; Frequency; Jitter; Oscilloscopes; Phase noise; Power engineering and energy; Sampling methods; Signal to noise ratio; Wideband;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronics, Circuits and Systems, 1999. Proceedings of ICECS '99. The 6th IEEE International Conference on
Conference_Location
Pafos
Print_ISBN
0-7803-5682-9
Type
conf
DOI
10.1109/ICECS.1999.814504
Filename
814504
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