• DocumentCode
    3449368
  • Title

    Improving the efficiency of parasitic extraction and simulation of 3D interconnect models

  • Author

    Silveira, L. Miguel ; Marques, Nuno ; Kamon, Mattan ; White, Jacob

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Inst. Superior Tecnico, Lisbon, Portugal
  • Volume
    3
  • fYear
    1999
  • fDate
    1999
  • Firstpage
    1729
  • Abstract
    As VLSI circuit speeds and density continue to increase, the need for accurately modeling the effects of three-dimensional interconnects has become essential to accurate chip and system design. Since such models are commonly used inside standard circuit simulators for time or frequency domain computations, efficiency requirements imply that those models must be kept very compact without compromising accuracy. In this paper we describe a technique based on the combination of two model order reduction algorithms applied to an integral equation approach to efficiently generate accurate, yet low order models of the impedance of 3D interconnect structures. The models thus generated are amenable to direction inclusion in standard circuit simulators
  • Keywords
    VLSI; circuit simulation; frequency-domain analysis; integral equations; integrated circuit interconnections; integrated circuit modelling; time-domain analysis; 3D interconnect models; VLSI circuits; direction inclusion; frequency domain computations; integral equation approach; low order models; model order reduction algorithms; parasitic extraction; standard circuit simulators; time domain computations; Capacitance; Circuit simulation; Computational modeling; Equivalent circuits; Frequency; Inductance; Integral equations; Integrated circuit interconnections; Reduced order systems; SPICE;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronics, Circuits and Systems, 1999. Proceedings of ICECS '99. The 6th IEEE International Conference on
  • Conference_Location
    Pafos
  • Print_ISBN
    0-7803-5682-9
  • Type

    conf

  • DOI
    10.1109/ICECS.1999.814510
  • Filename
    814510