• DocumentCode
    3449588
  • Title

    Turn-off analysis of the IGBT used in ZCS mode

  • Author

    Lefebvre, S. ; Forest, F. ; Calmon, F. ; Chante, S.P.

  • Author_Institution
    LESIR, CNRS, Cachan, France
  • fYear
    1994
  • fDate
    31 May-3 Jun 1994
  • Firstpage
    99
  • Lastpage
    104
  • Abstract
    This paper presents a study of the behaviour of PT and NPT IGBT in Zero Current Switching mode. Simulations allow one to estimate the stored charge during turn-off cycle in this switching mode. We observe and we explain how to reduce turn-off losses by action on the gate drive, or by the choice of the device technology
  • Keywords
    insulated gate bipolar transistors; IGBT; ZCS mode; device technology; gate drive; nonpunch-through devices; punch-through devices; stored charge; turn-off analysis; zero current switching; Bipolar transistors; Charge carrier lifetime; Circuit testing; Diodes; Inductors; Insulated gate bipolar transistors; Switches; Temperature; Voltage; Zero current switching;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Power Semiconductor Devices and ICs, 1994. ISPSD '94., Proceedings of the 6th International Symposium on
  • Conference_Location
    Davos
  • ISSN
    1063-6854
  • Print_ISBN
    0-7803-1494-8
  • Type

    conf

  • DOI
    10.1109/ISPSD.1994.583662
  • Filename
    583662