• DocumentCode
    3449745
  • Title

    New contrasts in the topographs of quartz obtained with the third generation synchrotron

  • Author

    Capelle, B. ; Detaint, J. ; Zarka, A. ; Epelboin, Y.

  • Author_Institution
    LMCP, Paris VII Univ., France
  • fYear
    1998
  • fDate
    27-29 May 1998
  • Firstpage
    816
  • Lastpage
    822
  • Abstract
    The synchrotron radiation delivered by the topography beam line of the European Synchrotron Radiation Facility (ESRF) was used to study quartz crystals and resonators. Several experimental set-ups taking advantage of the unique properties of the beam (very small divergence, extended spectra, time structure, etc.) were used to enhance the sensibility of detection of strain gradients due either to defects or to vibration modes. New contrasts were observed at the limits of the Z growth sectors (and also in the X or 8 sectors) in the most perfect crystals obtained by the crossed growth technique. In several samples of synthetic quartz, we have observed in the Z growth region, contrasts normal to the growth direction and resembling those of stacking faults. The increase of the sensibility of the stroboscopic technique has allowed to observe an important feature concerning the interaction of the vibration mode with the mounting clips (3rd overtone plano-convex resonator). The experiments and the results obtained are, in their principles, similar to those previously reported (1989) but the new experimental diffraction conditions bring an important increase of the sensibility of detection
  • Keywords
    X-ray topography; crystal defects; crystal resonators; quartz; strain measurement; surface topography measurement; synchrotron radiation; 3rd overtone piano-convex resonator; European Synchrotron Radiation Facility; SiO2; Z growth sectors; crossed growth technique; defects; mounting clips; quartz crystals; resonators; strain gradients; stroboscopic technique; synchrotron radiation; vibration mode; vibration modes; Capacitive sensors; Crystals; Diffraction; Optical reflection; Stacking; Surfaces; Synchrotron radiation;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Frequency Control Symposium, 1998. Proceedings of the 1998 IEEE International
  • Conference_Location
    Pasadena, CA
  • ISSN
    1075-6787
  • Print_ISBN
    0-7803-4373-5
  • Type

    conf

  • DOI
    10.1109/FREQ.1998.717994
  • Filename
    717994