• DocumentCode
    3450331
  • Title

    Intelligent control of semiconductor manufacturing processes

  • Author

    Chen, Su-Shing

  • Author_Institution
    Dept. of Comput. Sci., North Carolina Univ., Charlotte, NC, USA
  • fYear
    1992
  • fDate
    8-12 Mar 1992
  • Firstpage
    101
  • Lastpage
    108
  • Abstract
    The intelligent control mechanism relies on neural networks to model quantitatively semiconductor manufacturing processes. The learning capability of neural networks provides accurate approximations to these processes. The control strategy is based on fuzzy logic for capturing the heuristic knowledge and a feedforward neural network for capturing the process models. The hardware implementation of this scheme is under development. The limitations of classical control paradigms are reviewed. The concept of intelligent control is introduced, and ways to construct hybrid fuzzy logic/neural network controllers are discussed. Fuzzy logic control is examined. The neural network control is presented. The conceptual design of intelligent manufacturing architecture and its control mechanisms are given
  • Keywords
    feedforward neural nets; fuzzy control; fuzzy logic; intelligent control; process computer control; semiconductor device manufacture; factory automation; feedforward neural network; fuzzy control; fuzzy logic; intelligent control; intelligent manufacturing architecture; process control; semiconductor manufacturing; Adaptive control; Automatic control; Control systems; Fabrication; Feedback control; Feedforward neural networks; Fuzzy logic; Hardware; Intelligent control; Manufacturing automation; Manufacturing processes; Neural networks; Open loop systems; Process control;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Fuzzy Systems, 1992., IEEE International Conference on
  • Conference_Location
    San Diego, CA
  • Print_ISBN
    0-7803-0236-2
  • Type

    conf

  • DOI
    10.1109/FUZZY.1992.258602
  • Filename
    258602