Improvements to the Fermilab ionization profile monitor systems

The Ion Profile Monitor Systems have been studied in the Fermilab Tevatron, Main Injector, and Booster accelerators. These systems capture 64 K samples of both horizontal and vertical profiles at a turn by turn sample rate. Some early results have revealed various systematic problems and where improvements in the present system can be accomplished. Identification of these systematics and improvements for these systems are described. An entirely new design is planned which incorporates a magnetic field and can collect electrons instead of ions. In addition, selective gating of the top microchannel plate in a 2-plate system will allow us to minimize saturation and charge depletion problems