• DocumentCode
    3450865
  • Title

    Analysis of GTO failure mode during DC voltage blocking

  • Author

    Matsuda, H. ; Fujiwara, T. ; Hiyoshi, M. ; Nishitani, K. ; Kuwako, A. ; Ikehara, T.

  • Author_Institution
    Semicond. Group, Toshiba Corp., Kawasaki, Japan
  • fYear
    1994
  • fDate
    31 May-3 Jun 1994
  • Firstpage
    221
  • Lastpage
    225
  • Abstract
    GTOs suddenly failed without any leakage current increase before the failure event, during DC voltage blocking. From various experiments and the analysis, we have come to the inference that the GTO failure was caused by cosmic-rays at sea level. The failure rate of the improved GTOs decreases by more than one order
  • Keywords
    thyristors; DC voltage blocking; GTO failure mode; cosmic-rays; failure event; failure rate; sea level; Anodes; Concrete; Failure analysis; Laboratories; Leakage current; Neutrons; Protons; Sea level; Testing; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Power Semiconductor Devices and ICs, 1994. ISPSD '94., Proceedings of the 6th International Symposium on
  • Conference_Location
    Davos
  • ISSN
    1063-6854
  • Print_ISBN
    0-7803-1494-8
  • Type

    conf

  • DOI
    10.1109/ISPSD.1994.583727
  • Filename
    583727
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3450865