DocumentCode
3451267
Title
Non-Contact Dynamic Mode Atomic Force Microscope : Effects of nonlinear atomic forces
Author
Das, Soma ; Sreeram, P.A. ; Raychaudhuri, Arup K. ; Sai, T. Phanindra ; Brar, Loveleen K.
Author_Institution
DST unit for Nanosciences, S. N. Bose National Centre for Basic Sciences, Block-JD, Sector-III, Salt Lake, Kolkata 700098, INDIA.
fYear
2006
fDate
10-13 Jan. 2006
Firstpage
458
Lastpage
462
Abstract
We present an experimental investigation of the variation of the amplitude of vibrating microcantilever, as a function of distance (h) between the microcantilever and the sample in a Dynamic Force Microscopy (DFM) and explain the observations with a theoretical model. In DFM, as the cantilever tip approaches the sample, neither the force nor the response of the cantilever is in the linear regime. We present an exact numerical solution to the equation of motion of the oscillations of the microcantilever and present a quantitative explanation to the observed force versus distance curves, in terms of the resonance curves. We show that the change in the resonance frequency of the cantilever due to the atomic forces is highly nonlinear.
Keywords
Atomic force microscopy; Biological materials; Chaos; Design for manufacture; Molecular biophysics; Nonlinear equations; Physics; Probes; Resonance; Resonant frequency;
fLanguage
English
Publisher
ieee
Conference_Titel
Emerging Technologies - Nanoelectronics, 2006 IEEE Conference on
Print_ISBN
0-7803-9357-0
Type
conf
DOI
10.1109/NANOEL.2006.1609771
Filename
1609771
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