• DocumentCode
    3452045
  • Title

    SPICE Model of SiC JFETs for Circuit Simulations

  • Author

    Wang, Yi ; Cass, Callaway J. ; Chow, T. Paul ; Wang, Fred ; Boroyevich, Dushan

  • Author_Institution
    Dept. of Electr. Comput. & Syst. Eng., Rensselaer Polytech. Inst., Troy, NY
  • fYear
    2006
  • fDate
    16-19 July 2006
  • Firstpage
    212
  • Lastpage
    215
  • Abstract
    This paper presents SPICE model for one kind of high voltage transistors-1200 V, 5A SiC JFET. Temperature dependent characterization of the device has been done up to 200 degC. Switching behavior has also been studied at 600 V, 5 A level. Based on both static and dynamic characterizations, this paper focuses on SPICE modeling work of such a device for circuit simulations. The model parameters have been extracted from experimental plots. Simulations are then used to verify the developed compact model. Reasonably good agreement has been obtained between the model and experimental results
  • Keywords
    SPICE; junction gate field effect transistors; power semiconductor switches; semiconductor device models; silicon compounds; 1200 V; 5 A; 600 V; JFET; SPICE model; SiC; circuit simulations; dynamic characterizations; high voltage transistors; parameter extraction; static characterizations; switching behavior; temperature dependent characterization; Circuit simulation; JFETs; MOSFET circuits; Power electronics; Power system modeling; SPICE; Silicon carbide; Switches; Temperature dependence; USA Councils;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Computers in Power Electronics, 2006. COMPEL '06. IEEE Workshops on
  • Conference_Location
    Troy, NY
  • ISSN
    1093-5142
  • Print_ISBN
    0-7803-9724-X
  • Electronic_ISBN
    1093-5142
  • Type

    conf

  • DOI
    10.1109/COMPEL.2006.305677
  • Filename
    4097489