Reliability of an electro-absorption modulator integrated with a distributed feedback laser

Author

Kamioka, H. ; Fukuda, M. ; Takeuchi, H. ; Iga, R. ; Kishi, K. ; Yasaka, H. ; Tsuda, H. ; Yokoyama, K. ; Tohmori, Y. ; Itaya, Y.

Author_Institution

NTT Photonics Labs., Kanagawa, Japan

Volume

4

fYear

1999

fDate

Aug. 30 1999-Sept. 3 1999

Firstpage

1202

Abstract

There are few reports on the reliability of an electro-absorption modulator integrated with a distributed feedback laser (EA-DFB laser), although this is a very important photonic device in wavelength-division multiplexing (WDM) systems. We present the degradation modes in the EA-DFB laser, showing the lifetime is not determined by the degradation of the modulator but by that of the DFB laser, and then confirming the laser´s stability under long-term operation. The devices we tested consisted of an EA modulator and a DFB laser that were integrated with butt-joint technology. The active layer of the DFB laser and the absorption layer of the modulator were composed of InGaAsP wells and InGaAsP barriers and were buried in Fe-doped InP.

Keywords

III-V semiconductors; distributed feedback lasers; electro-optical modulation; electroabsorption; gallium arsenide; gallium compounds; indium compounds; integrated optics; laser beams; laser feedback; optical transmitters; quantum well lasers; reliability; wavelength division multiplexing; DFB laser; InGaAsP; InGaAsP barriers; InGaAsP wells; InP:Fe; absorption layer; active layer; butt-joint technology; degradation; degradation modes; distributed feedback laser; electro-absorption modulator; long-term operation; photonic device; reliability; wavelength-division multiplexing systems; Absorption; Degradation; Distributed feedback devices; Indium phosphide; Laser feedback; Laser modes; Laser stability; Optical modulation; Testing; Wavelength division multiplexing;

fLanguage

English

Publisher

ieee

Conference_Titel

Lasers and Electro-Optics, 1999. CLEO/Pacific Rim '99. The Pacific Rim Conference on

Conference_Location

Seoul, South Korea

Print_ISBN

0-7803-5661-6

Type

conf

DOI

10.1109/CLEOPR.1999.814735

Filename

814735