• DocumentCode
    3452623
  • Title

    Reproducibility of photo-nanoimprint

  • Author

    Hiroshima, H. ; Kurashima, Y. ; Komuro, M.

  • fYear
    2004
  • fDate
    Oct. 27-29, 2004
  • Firstpage
    70
  • Lastpage
    71
  • Keywords
    Atomic force microscopy; Calibration; Degradation; Distortion measurement; Image edge detection; Image resolution; Nanolithography; Nonlinear distortion; Polymers; Reproducibility of results;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microprocesses and Nanotechnology Conference, 2004. Digest of Papers. 2004 International
  • Print_ISBN
    4-99024720-5
  • Type

    conf

  • DOI
    10.1109/IMNC.2004.245727
  • Filename
    1459477