Title :
A SOI-CMOS compatible smart yarn technology
Author :
Hongen Tu ; Yong Xu
Author_Institution :
Electr. & Comput. Eng., Wayne State Univ., Detroit, MI, USA
Abstract :
Smart yarns and intelligent textiles have been researched for quite some time. However, most smart yarns and textiles developed so far do not come with sophisticated functionalities due to the fact that silicon-based sensors and CMOS circuits cannot be seamlessly integrated. This paper reports a SOI-CMOS compatible technology to fabricate smart yarns, enabling the monolithic and invisible integration of CMOS and sensors. A tubular shaped parylene smart yarn with reinforcing PMDS core has been developed. Isotropic XeF2 silicon etching and conformal parylene coating were used to form the outer shell and release the electronic/sensing components from a SOI wafer. PDMS cores were injected after the release to reinforce and strengthen the yarns. To prove the concept, silicon strain gauges and MOSFETs were first integrated.
Keywords :
CMOS integrated circuits; MOSFET; elemental semiconductors; etching; intelligent materials; polymers; silicon; silicon-on-insulator; strain gauges; strain sensors; yarn; MOSFET; PMDS core; SOI-CMOS compatible smart yarn technology; Si; conformal parylene coating; invisible integration; isotropic XeF2 silicon etching; monolithic integration; sensors; silicon strain gauges; tubular shaped parylene smart yarn; MOSFET; Optical fiber sensors; Silicon; Strain; Yarn; Intelligent Textiles; PDMS; Parylene; SOI-CMOS; Smart Yarn;
Conference_Titel :
Solid-State Sensors, Actuators and Microsystems (TRANSDUCERS & EUROSENSORS XXVII), 2013 Transducers & Eurosensors XXVII: The 17th International Conference on
Conference_Location :
Barcelona
DOI :
10.1109/Transducers.2013.6626723