• DocumentCode
    3452765
  • Title

    Silicon on Insulator CMOS with Hybrid Crystal Orientation Using Double Wafer Bonding

  • Author

    Chan, K.K. ; Yang, M. ; Shi, L. ; Kumar, A. ; Ott, J.A. ; Patel, J. ; Schultz, R. ; Kry, H. ; Zhang, Y. ; Sikorski, E. ; Graham, W. ; To, B. ; Medd, S. ; Canaperi, D. ; Newbury, J. ; Scerbo, C. ; Meyer, R. ; Emic, C.D. ; Ieong, M.

  • Author_Institution
    IBM Semiconductor Research and Development Center, Research Division, T.J. Watson Research Center, Yorktown Heights, NY 10598. Email: kkchan@us.IBM.com, Phone : (914)945-3166, Fax : (914)945-2141
  • fYear
    2006
  • fDate
    26-28 June 2006
  • Firstpage
    41
  • Lastpage
    42
  • Keywords
    CMOS process; CMOS technology; Etching; Fabrication; Oxidation; Silicon on insulator technology; Substrates; Temperature; Voltage; Wafer bonding;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Device Research Conference, 2006 64th
  • Conference_Location
    State College, PA, USA
  • ISSN
    1548-3770
  • Print_ISBN
    0-7803-9748-7
  • Type

    conf

  • DOI
    10.1109/DRC.2006.305110
  • Filename
    4097527