• DocumentCode
    3452777
  • Title

    Development OF Nanogap Automated Permittivity Measurement System for DNA hybridization detection kit

  • Author

    Saifullah, A. ; Azri, M.E. ; Hashim, U.

  • Author_Institution
    Inst. of Nano Electron. Eng. (INNE), Univ. Malaysia Perlis, Kuala Perlis, Malaysia
  • fYear
    2009
  • fDate
    14-15 Dec. 2009
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    The nanogap automated permittivity measurement system (APMS) are fabricated as low cost, portable and label free DNA hybridization detection kit. The nanogap capacitor can react as a dna sensor. The difference in dielectric properties of single-stranded DNA (SSDNA) and double-stranded DNA (DSDNA) are allowing the use of permittivity measurement for DNA hybridization detection. In this project, an automated measurement system is introduced as an interface for nanogap capacitor. Sine wave frequency from 1 Hz until 100 kHz will be applied to the nanogap capacitor and it voltage wave and current wave are measured and analyzed. Three measurements will be made, capacitance measurement of nanogap with no sample, permittivity measurement of after immobilization and after hybridization. If the measurement show a considerably difference in permittivity value, the DNA is consider hybridize. Otherwise is it considered mismatch. In this project, an artificial neural network (ANN) will also be introduced for decision making of the result based on the permittivity measurement. This will allow the user to get the result without comparing the output.
  • Keywords
    DNA; bioelectric phenomena; biology computing; biosensors; capacitors; molecular biophysics; nanobiotechnology; neural nets; permittivity measurement; DNA hybridization detection kit; DNA sensor; artificial neural network; frequency 1 Hz to 100 kHz; immobilization; nanogap automated permittivity measurement system; nanogap capacitor; Artificial neural networks; Capacitance measurement; Capacitive sensors; Capacitors; Costs; DNA; Dielectric measurements; Frequency; Permittivity measurement; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Technical Postgraduates (TECHPOS), 2009 International Conference for
  • Conference_Location
    Kuala Lumpur
  • Print_ISBN
    978-1-4244-5223-1
  • Electronic_ISBN
    978-1-4244-5224-8
  • Type

    conf

  • DOI
    10.1109/TECHPOS.2009.5412092
  • Filename
    5412092