Title :
New RF-probe pad and interconnection model and parameter extraction technique for HBT equivalent circuit
Author :
Lee, Seongheam ; Gopinath, Anand
Author_Institution :
Dept. of Electr. Eng., Minnesota Univ., Minneapolis, MN, USA
Abstract :
A novel equivalent circuit model of RF probe pads and interconnections for S-parameter measurements, together with a novel parameter extraction method based on the S-parameter measurements of HBTs (heterojunction bipolar transistors) in the cutoff mode, is presented. This circuit and the extraction technique give very accurate and self-consistent results. The extracted equivalent circuit of the device and probe-pattern parasitics using the technique show excellent agreement with the measured S-parameters
Keywords :
S-parameters; equivalent circuits; heterojunction bipolar transistors; microwave measurement; semiconductor device models; solid-state microwave devices; HBT equivalent circuit; HF characterisation; RF-probe pad; S-parameter measurements; cutoff mode; equivalent circuit extraction; equivalent circuit model; heterojunction bipolar transistors; interconnection model; parameter extraction method; parameter extraction technique; probe-pattern parasitics; self-consistent results; Atherosclerosis; Capacitance; Equivalent circuits; Heterojunction bipolar transistors; Integrated circuit interconnections; Integrated circuit measurements; Parameter extraction; Probes; Radio frequency; Scattering parameters;
Conference_Titel :
Bipolar Circuits and Technology Meeting, 1991., Proceedings of the 1991
Conference_Location :
Minneapolis, MN
Print_ISBN :
0-7803-0103-X
DOI :
10.1109/BIPOL.1991.160986
