DocumentCode
3452982
Title
Simple energy level model for frequency degradation of USO under radiation
Author
Carlotti, J.F. ; Boy, J.J. ; Cibiel, G. ; Inguimbert, C.
Author_Institution
Inst. Femto-ST, Besancon
fYear
2007
fDate
May 29 2007-June 1 2007
Firstpage
185
Lastpage
188
Abstract
Space radiations are responsible of transient and permanent shifts of the output frequency signal of any quartz crystal oscillator. In this paper, the degradation of quartz crystals under radiation stresses is shown to be related to competition between trapping and recombination of radiation-induced carriers in quartz lattice. The presented model exhibits a good agreement with experimental data.
Keywords
circuit stability; crystal oscillators; frequency response; radiation effects; satellite communication; stress effects; USO frequency degradation; carriers trapping; energy level model; permanent frequency shifts; quartz crystal oscillator; quartz lattice; radiation stresses; radiation-induced carriers recombination; space radiations; transient frequency shifts; ultra stable oscillators; Degradation; Energy states; Frequency;
fLanguage
English
Publisher
ieee
Conference_Titel
Frequency Control Symposium, 2007 Joint with the 21st European Frequency and Time Forum. IEEE International
Conference_Location
Geneva
ISSN
1075-6787
Print_ISBN
978-1-4244-0646-3
Electronic_ISBN
1075-6787
Type
conf
DOI
10.1109/FREQ.2007.4319060
Filename
4319060
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