Title :
Precise absorption line feature measurements with higher harmonic detection
Author :
Barrington, J.M. ; Jogu, R. ; Kuhn, T.R. ; Bullock, A.M. ; Dharamsi, A.N.
Author_Institution :
Dept. of Electr. & Comput. Eng., Old Dominion Univ., Norfolk, VA, USA
Abstract :
Summary form only given. Wavelength modulation spectroscopy (WMS) with simultaneous detection at several harmonics of the modulation frequency is described. The method´s precision is within two percent which allows very small deviations in the signal to be extracted. The novel approach taken allows non-intrusive measurements to be obtained using a compact, inexpensive instrument.
Keywords :
measurement errors; modulation spectroscopy; optical harmonic generation; spectral line narrowing; compact inexpensive instrument; higher harmonic detection; modulation frequency; nonintrusive measurements; precise absorption line feature measurements; simultaneous detection; small signal deviations extraction; very small deviations; wavelength modulation spectroscopy; Absorption; Circuit stability; Frequency estimation; Frequency modulation; Laser stability; Laser tuning; Optimized production technology; Probes; Spectroscopy; Wavelength measurement;
Conference_Titel :
Lasers and Electro-Optics, 2001. CLEO '01. Technical Digest. Summaries of papers presented at the Conference on
Conference_Location :
Baltimore, MD, USA
Print_ISBN :
1-55752-662-1
DOI :
10.1109/CLEO.2001.947979
