Title :
Intermodulation Crosstalk Characteristics of WDM Silicon Microring Modulators
Author :
Padmaraju, Kishore ; Xiaoliang Zhu ; Long Chen ; Lipson, Michal ; Bergman, Keren
Author_Institution :
Dept. of Electr. Eng., Columbia Univ., New York, NY, USA
Abstract :
We elaborate on and experimentally characterize the intermodulation crosstalk properties of a 10-Gb/s silicon microring modulator. Bit-error-rate measurements and eye diagrams are used to discern the degradation in signal quality due to intermodulation crosstalk. Evaluation of the power penalties with varying channel spacing are used to support wavelength-division-multiplexed cascaded microring modulator channel spacings as dense as 100 GHz with negligible expected intermodulation crosstalk.
Keywords :
elemental semiconductors; intermodulation; intersymbol interference; micromechanical devices; optical crosstalk; optical interconnections; optical modulation; silicon; wavelength division multiplexing; Si; WDM silicon microring modulators; bit-error-rate; channel spacing; eye diagrams; intermodulation crosstalk characteristics; optical interconnects; power penalties; signal quality; wavelength-division-multiplexed cascaded microring modulator; Bit error rate; Channel spacing; Crosstalk; Modulation; Optical crosstalk; Silicon; Wavelength division multiplexing; Intersymbol interference; microring modulator; optical modulation; wavelength division multiplexing;
Journal_Title :
Photonics Technology Letters, IEEE
DOI :
10.1109/LPT.2014.2326621
