DocumentCode
3453740
Title
Extraction of Accumulation Mobility from C-V Characteristics of Pentacene MIS Structures
Author
Jung, Keum-Dong ; Lee, Cheon An ; Park, Dong-Wook ; Park, Byung-Gook ; Shin, Hyungcheol ; Lee, Jong Duk
Author_Institution
Inter-University Semiconductor Research Center (ISRC) and School of Electrical Engineering, Seoul National University, San 56-1, Sillim-dong, Gwanak-gu, Seoul 151-742, Republic of Korea. Tel: +82-2-880-7282, Fax: +82-2-882-4658, e-mail: windbit@naver.com
fYear
2006
fDate
26-28 June 2006
Firstpage
139
Lastpage
140
Keywords
Capacitance; Capacitance-voltage characteristics; Electrical resistance measurement; Equations; Frequency measurement; Insulation; OFETs; Pentacene; Silicon; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Device Research Conference, 2006 64th
Conference_Location
State College, PA, USA
ISSN
1548-3770
Print_ISBN
0-7803-9748-7
Type
conf
DOI
10.1109/DRC.2006.305157
Filename
4097574
Link To Document