• DocumentCode
    3453788
  • Title

    Improved Electronic Interfaces for Heavy Loaded AT Cut Quartz Crystal Microbalance Sensors

  • Author

    Arnau, Antonio ; García, José V. ; Jiménez, Yolanda ; Ferrari, Vittorio ; Ferrari, Marco

  • Author_Institution
    Univ. Polytech. de Valencia, Valencia
  • fYear
    2007
  • fDate
    May 29 2007-June 1 2007
  • Firstpage
    357
  • Lastpage
    362
  • Abstract
    A new configuration of an automatic capacitance compensation (ACC) technique based on an oscillator-like working interface, which permits the tracking of the series resonant frequency, the monitoring of the motional resistance and the parallel capacitance of a thickness-shear mode (TSM) quartz crystal microbalance (QCM) sensor, is introduced. The new configuration permits an easier calibration of the system which, in principle, improves the accuracy. Experimental results are reported with 9 and 10 MHz crystals in liquid with different parallel capacitances which demonstrate the effectiveness of the capacitance compensation. Some frequency deviations from the exact series resonant frequency, measured by an impedance analyzer, are explained by the specific non idealities of the circuit. A tentative approach is proposed to solve this problem that is also common to previous ACC systems.
  • Keywords
    calibration; capacitance; microbalances; microsensors; quartz; automatic capacitance compensation technique; calibration; electronic interfaces; heavy loaded AT cut; impedance analyzer; motional resistance monitoring; oscillator-like working interface; parallel capacitance monitoring; parallel capacitances; quartz crystal microbalance sensors; resonant frequency; thickness-shear mode; Calibration; Capacitance; Capacitive sensors; Computerized monitoring; Frequency measurement; Impedance measurement; Liquid crystals; RLC circuits; Resonant frequency; Tracking;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Frequency Control Symposium, 2007 Joint with the 21st European Frequency and Time Forum. IEEE International
  • Conference_Location
    Geneva
  • ISSN
    1075-6787
  • Print_ISBN
    978-1-4244-0646-3
  • Electronic_ISBN
    1075-6787
  • Type

    conf

  • DOI
    10.1109/FREQ.2007.4319097
  • Filename
    4319097