DocumentCode
3454133
Title
Characteristics of thermal treated quantum dot infrared photodetector
Author
Hwang, Su Hwan ; Shin, J.C. ; Song, J.D. ; Choi, W.J. ; Lee, J.I. ; Han, H. ; Lee, Sang-Won ; Kwack, H.S. ; Cho, Y.H.
fYear
2004
fDate
Oct. 27-29, 2004
Firstpage
174
Lastpage
175
Keywords
Carrier confinement; Dark current; Electrons; Infrared detectors; Photodetectors; Physics; Quantum dots; Thermal degradation; US Department of Transportation; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Microprocesses and Nanotechnology Conference, 2004. Digest of Papers. 2004 International
Print_ISBN
4-99024720-5
Type
conf
DOI
10.1109/IMNC.2004.245780
Filename
1459530
Link To Document