Title :
Neutron radiation test of graphic processing units
Author :
Rech, P. ; Aguiar, C. ; Ferreira, R. ; Frost, C. ; Carro, L.
Author_Institution :
Univ. Fed. do Rio Grande do Sul, Porto Alegre, Brazil
Abstract :
This paper reports and analyzes the results of neutrons radiation testing campaigns on a modern commercial-off-the-shelf Graphic Processing Unit (GPU). A set of guidelines for accelerated radiation experiments on CPUs is presented, emphasizing the shrewdness necessary to ease the test and gain meaningful data. Radiation test results are presented and discussed, highlighting the neutrons sensitivities of the different GPU memory and logic resources in terms of Failure In Time (FIT) due to neutrons at sea level.
Keywords :
failure analysis; graphics processing units; integrated circuit reliability; integrated circuit testing; life testing; logic circuits; neutron effects; storage management chips; FIT; GPU; GPU memory; accelerated radiation experiments; commercial-off-the-shelf graphic processing unit; failure in time; logic resources; neutron radiation testing campaigns; neutrons sensitivity; sea level; Barium; DH-HEMTs; Helium; Testing; GPU; Single Event Latchup; Single Event Transient; Single Event Upset; neutron radiation testing;
Conference_Titel :
On-Line Testing Symposium (IOLTS), 2012 IEEE 18th International
Conference_Location :
Sitges
Print_ISBN :
978-1-4673-2082-5
DOI :
10.1109/IOLTS.2012.6313841
