Neutron radiation test of graphic processing units

Author

Rech, P. ; Aguiar, C. ; Ferreira, R. ; Frost, C. ; Carro, L.

Author_Institution

Univ. Fed. do Rio Grande do Sul, Porto Alegre, Brazil

fYear

2012

fDate

27-29 June 2012

Firstpage

55

Lastpage

60

Abstract

This paper reports and analyzes the results of neutrons radiation testing campaigns on a modern commercial-off-the-shelf Graphic Processing Unit (GPU). A set of guidelines for accelerated radiation experiments on CPUs is presented, emphasizing the shrewdness necessary to ease the test and gain meaningful data. Radiation test results are presented and discussed, highlighting the neutrons sensitivities of the different GPU memory and logic resources in terms of Failure In Time (FIT) due to neutrons at sea level.

Keywords

failure analysis; graphics processing units; integrated circuit reliability; integrated circuit testing; life testing; logic circuits; neutron effects; storage management chips; FIT; GPU; GPU memory; accelerated radiation experiments; commercial-off-the-shelf graphic processing unit; failure in time; logic resources; neutron radiation testing campaigns; neutrons sensitivity; sea level; Barium; DH-HEMTs; Helium; Testing; GPU; Single Event Latchup; Single Event Transient; Single Event Upset; neutron radiation testing;

fLanguage

English

Publisher

ieee

Conference_Titel

On-Line Testing Symposium (IOLTS), 2012 IEEE 18th International

Conference_Location

Sitges

Print_ISBN

978-1-4673-2082-5

Type

conf

DOI

10.1109/IOLTS.2012.6313841

Filename

6313841