• DocumentCode
    3454621
  • Title

    Simulation of geometry and surface effects in short gate length MESFETs and HEMTs

  • Author

    Asenov, A. ; Babiker, S. ; Cameron, N. ; Beaumont, S.P.

  • Author_Institution
    Dept. of Electron. & Electr. Eng., Glasgow Univ., UK
  • fYear
    1995
  • fDate
    35037
  • Firstpage
    42401
  • Lastpage
    42406
  • Abstract
    We summarise the features of the physical device simulators required for the design of new generation MESFETs and HEMTs. We also present the Glasgow simulation code H2F which meets most of these requirements. With the rapidly growing power of the single and multiple processor platforms the use of physical simulations including MC in the design process becomes not only necessary but feasible. We illustrate some of these points with steady-state and transient simulations
  • Keywords
    Schottky gate field effect transistors; digital simulation; electronic engineering computing; high electron mobility transistors; semiconductor device models; Glasgow simulation code; H2F; HEMT design; MC; MESFET design; geometry effects; physical device simulators; short gate length HEMTs; short gate length MESFETs; steady-state simulation; surface effects; transient simulation;
  • fLanguage
    English
  • Publisher
    iet
  • Conference_Titel
    Terahertz Technology, IEE Colloquium on
  • Conference_Location
    London
  • Type

    conf

  • DOI
    10.1049/ic:19951484
  • Filename
    495120