DocumentCode
3454621
Title
Simulation of geometry and surface effects in short gate length MESFETs and HEMTs
Author
Asenov, A. ; Babiker, S. ; Cameron, N. ; Beaumont, S.P.
Author_Institution
Dept. of Electron. & Electr. Eng., Glasgow Univ., UK
fYear
1995
fDate
35037
Firstpage
42401
Lastpage
42406
Abstract
We summarise the features of the physical device simulators required for the design of new generation MESFETs and HEMTs. We also present the Glasgow simulation code H2F which meets most of these requirements. With the rapidly growing power of the single and multiple processor platforms the use of physical simulations including MC in the design process becomes not only necessary but feasible. We illustrate some of these points with steady-state and transient simulations
Keywords
Schottky gate field effect transistors; digital simulation; electronic engineering computing; high electron mobility transistors; semiconductor device models; Glasgow simulation code; H2F; HEMT design; MC; MESFET design; geometry effects; physical device simulators; short gate length HEMTs; short gate length MESFETs; steady-state simulation; surface effects; transient simulation;
fLanguage
English
Publisher
iet
Conference_Titel
Terahertz Technology, IEE Colloquium on
Conference_Location
London
Type
conf
DOI
10.1049/ic:19951484
Filename
495120
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