Title :
Analysis and design of an adaptive proactive reconfiguration approach for memristive crossbar memories
Author :
Pouyan, Peyman ; Amat, Esteve ; Rubio, Antonio
Author_Institution :
Dept. of Electron. Eng., UPC Barcelona Tech, Barcelona, Spain
Abstract :
Memristive devices are being considered as a promising alternative to implement future memory cells. However, manufacturing process at nano-scale sizes makes them susceptible to several kinds of reliability concerns, and consequently it becomes necessary to design innovative architectures to overcome these drawbacks. This paper presents the design basis of a proactive reconfiguration approach in memristive crossbars, in order to extend the system lifetime by utilizing available resources in an intense way and without need of failure recovery. Then, an architectural implementation of a this crossbar with adaptive proactive realization, i.e. a proactive strategy by adjustable shifting, is introduced, what can improve the reliability and extend their lifetime up to 65% in comparison with non-adaptive reconfiguration strategy.
Keywords :
memory architecture; memristors; random-access storage; reliability; adaptive proactive reconfiguration approach; memory cells; memristive crossbar memories; memristive devices; Aging; Computer architecture; Memristors; Reliability engineering; Resistance; Testing; Reliability; crossbar; endurance; memristor; proactive reconfiguration; process variability;
Conference_Titel :
Nanoscale Architectures (NANOARCH), 2015 IEEE/ACM International Symposium on
Conference_Location :
Boston, MA
DOI :
10.1109/NANOARCH.2015.7180594