• DocumentCode
    3455309
  • Title

    Defect consideratons for robust sparse coding using memristor arrays

  • Author

    Sheridan, Patrick ; Lu, Wei D.

  • Author_Institution
    Dept. of Electr. Eng. & Comput. Sci., Univ. of Michigan, Ann Arbor, MI, USA
  • fYear
    2015
  • fDate
    8-10 July 2015
  • Firstpage
    137
  • Lastpage
    138
  • Abstract
    The performance of a memristor network with defects is investigated on a sparse coding task. It was found that moderate levels SA0 faults do not significantly impact algorithm performance, while SA1 faults effectively reduce dictionary size.
  • Keywords
    image coding; image sampling; memristor circuits; neural nets; SA0 faults; SA1 faults; dictionary size; memristor arrays; memristor network; robust sparse coding; Dictionaries; Electrodes; Encoding; Memristors; Neurons; Performance evaluation; Training; Memristor; crossbar; fault tolerance; sparse coding;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Nanoscale Architectures (NANOARCH), 2015 IEEE/ACM International Symposium on
  • Conference_Location
    Boston, MA
  • Type

    conf

  • DOI
    10.1109/NANOARCH.2015.7180600
  • Filename
    7180600
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3455309