• DocumentCode
    3455353
  • Title

    Measurement of Minority Carrier Diffusion Lengths in Semiconductor Nanowires

  • Author

    Allen, Jonathan E. ; Gu, Yi ; Romankiewicz, John P. ; Lensch, Jessica L. ; May, Steven J. ; Odom, Teri W. ; Wessels, Bruce W. ; Lauhon, Lincoln J.

  • Author_Institution
    Department of Materials Science and Engineering, Northwestern University, 2220 Campus Drive, Evanston, IL 60208
  • fYear
    2006
  • fDate
    26-28 June 2006
  • Firstpage
    289
  • Lastpage
    290
  • Keywords
    Chemical technology; Electric variables measurement; Length measurement; Materials science and technology; Nanowires; Optical microscopy; Photoconductivity; Schottky barriers; Space charge; Wire;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Device Research Conference, 2006 64th
  • Conference_Location
    State College, PA, USA
  • ISSN
    1548-3770
  • Print_ISBN
    0-7803-9748-7
  • Type

    conf

  • DOI
    10.1109/DRC.2006.305186
  • Filename
    4097641
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3455353