• DocumentCode
    3455358
  • Title

    Development of analysis techniques for SAW transverse-coupled waveguide resonator filters

  • Author

    Morgan, David P. ; Richards, S. ; Staples, A.

  • Author_Institution
    Impulse Consulting, Northampon, UK
  • Volume
    1
  • fYear
    1996
  • fDate
    3-6 Nov 1996
  • Firstpage
    177
  • Abstract
    This paper describes an effective analysis method for the transverse-coupled SAW filter (TCF), which comprises two adjacent one-port resonators close enough to have useful acoustic coupling. Waveguiding is an essential feature of this device, and here waveguiding is analysed by a novel technique which has the versatility of the well-known stack matrix method but is simpler to apply. To obtain good agreement with experiment, it is found that it is essential to include anisotropy in the waveguide analysis. For each of the two waveguide modes (symmetric, antisymmetric), the device is analysed as if it were a conventional one-port, one-track resonator, using coupled mode (COM) analysis. The resulting admittances are combined to give the device Y-matrix, from which the scattering matrix S is easily found. The parameters required for the COM analysis (velocities etc.) are deduced from plane-wave data given in the literature. Theoretical results agree well with experiment, for 190 MHz devices using ST-cut quartz
  • Keywords
    S-matrix theory; coupled mode analysis; electric admittance; surface acoustic wave resonator filters; surface acoustic wave waveguides; 190 MHz; COM analysis; SAW resonator filters; ST-cut quartz; acoustic coupling; admittances; coupled mode analysis; device Y-matrix; one-port resonators; scattering matrix; stack matrix method; transverse-coupled SAW filter; Coupled mode analysis; Electrodes; Gratings; Reflection; Resonator filters; SAW filters; Semiconductor waveguides; Surface acoustic waves; Transducers; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Ultrasonics Symposium, 1996. Proceedings., 1996 IEEE
  • Conference_Location
    San Antonio, TX
  • ISSN
    1051-0117
  • Print_ISBN
    0-7803-3615-1
  • Type

    conf

  • DOI
    10.1109/ULTSYM.1996.583954
  • Filename
    583954