DocumentCode
3455568
Title
Direct modification near the interface of SiO2/Si[001] by low energy N+ ion beam irradiation
Author
HACHIUE, Syunsuke ; Teraoka, Yuden
fYear
2004
fDate
Oct. 27-29, 2004
Firstpage
272
Lastpage
273
Keywords
Bonding; Filters; Ion beams; Ion sources; Kinetic energy; Photoelectricity; Plasma accelerators; Plasma sources; Plasma transport processes; Synchrotron radiation;
fLanguage
English
Publisher
ieee
Conference_Titel
Microprocesses and Nanotechnology Conference, 2004. Digest of Papers. 2004 International
Print_ISBN
4-99024720-5
Type
conf
DOI
10.1109/IMNC.2004.245647
Filename
1459581
Link To Document