• DocumentCode
    3455658
  • Title

    Performance Verification of Injection Locked STW Clocks with BAW Crystal Stability

  • Author

    Avramov, I.D. ; Columbus, J.

  • Author_Institution
    Inst. of Solid State Phys., Sofia
  • fYear
    2007
  • fDate
    May 29 2007-June 1 2007
  • Firstpage
    771
  • Lastpage
    778
  • Abstract
    This work verifies the expected phase noise and medium-term stability improvement of recently proposed 1 GHz surface transverse wave (STW) injection locked clocks operating on 1.25 V supply voltage with bulk acoustic wave (BAW) crystal stability. Compared to a free running STW oscillator, temperature stability improvement by a factor of 16 and close-in phase noise reduction by 18 to 25 dB is demonstrated. A high-power version of the system consumes 90 mA of DC current, generates 4 dBm of output power at 1 GHz and provides a thermal noise floor of -174 dBc/Hz. A low-power version demonstrates safe lock and integrated r.m.s. jitter of 220 to 640 fs over a (0 to +85)degC temperature range. Data on phase noise, output power and frequency sensitivities to supply voltage variations over temperature are provided and discussed. Ways for potential improvement of system performance are suggested.
  • Keywords
    bulk acoustic wave devices; clocks; injection locked oscillators; jitter; stability; surface acoustic wave oscillators; BAW crystal stability; bulk acoustic wave; comb spectrum oscillators; current 90 mA; frequency 1 GHz; injection locked STW clocks; integrated r.m.s. jitter; phase noise; surface transverse wave; temperature stability; voltage 1.25 V; Acoustic waves; Clocks; DC generators; Injection-locked oscillators; Phase noise; Power generation; Stability; Surface acoustic waves; Temperature sensors; Voltage; BAW crystals; STW resonators; comb spectrum oscillators; injection locked oscillators; phase noise;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Frequency Control Symposium, 2007 Joint with the 21st European Frequency and Time Forum. IEEE International
  • Conference_Location
    Geneva
  • ISSN
    1075-6787
  • Print_ISBN
    978-1-4244-0646-3
  • Electronic_ISBN
    1075-6787
  • Type

    conf

  • DOI
    10.1109/FREQ.2007.4319180
  • Filename
    4319180