DocumentCode
3455667
Title
Statistical Component Variability Effects on Oscillator Phase Noise Performance
Author
Green, Patrick A.
Author_Institution
Northrop Grumman Electron. Syst., Baltimore
fYear
2007
fDate
May 29 2007-June 1 2007
Firstpage
779
Lastpage
783
Abstract
Component and circuit variations can cause oscillator phase noise degradation. Leveraging component statistical performance such as sustaining stage amplifier residual phase noise, gain variation, resonator Q´s, circuit insertion loss, and other component tolerances, a simple model can be produced with these input variables and provide an accurate representation of phase noise performance yields for a given specification or conversely provide a high production yield performance specification. Manufacturers of these components have measured data and/or statistical information regarding many of these parameters. If only measured data exists, there are software tools available that will create probability distributions of the measured data. This paper will describe a method on how statistical analysis can be applied to a simple oscillator structure.
Keywords
oscillators; phase noise; statistical analysis; statistical distributions; high production yield performance specification; oscillator phase noise; oscillator structure; probability distribution; statistical analysis; statistical component variability; Circuits; Degradation; Input variables; Insertion loss; Oscillators; Performance gain; Performance loss; Phase noise; Production; Software measurement;
fLanguage
English
Publisher
ieee
Conference_Titel
Frequency Control Symposium, 2007 Joint with the 21st European Frequency and Time Forum. IEEE International
Conference_Location
Geneva
ISSN
1075-6787
Print_ISBN
978-1-4244-0646-3
Electronic_ISBN
1075-6787
Type
conf
DOI
10.1109/FREQ.2007.4319181
Filename
4319181
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