• DocumentCode
    3455667
  • Title

    Statistical Component Variability Effects on Oscillator Phase Noise Performance

  • Author

    Green, Patrick A.

  • Author_Institution
    Northrop Grumman Electron. Syst., Baltimore
  • fYear
    2007
  • fDate
    May 29 2007-June 1 2007
  • Firstpage
    779
  • Lastpage
    783
  • Abstract
    Component and circuit variations can cause oscillator phase noise degradation. Leveraging component statistical performance such as sustaining stage amplifier residual phase noise, gain variation, resonator Q´s, circuit insertion loss, and other component tolerances, a simple model can be produced with these input variables and provide an accurate representation of phase noise performance yields for a given specification or conversely provide a high production yield performance specification. Manufacturers of these components have measured data and/or statistical information regarding many of these parameters. If only measured data exists, there are software tools available that will create probability distributions of the measured data. This paper will describe a method on how statistical analysis can be applied to a simple oscillator structure.
  • Keywords
    oscillators; phase noise; statistical analysis; statistical distributions; high production yield performance specification; oscillator phase noise; oscillator structure; probability distribution; statistical analysis; statistical component variability; Circuits; Degradation; Input variables; Insertion loss; Oscillators; Performance gain; Performance loss; Phase noise; Production; Software measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Frequency Control Symposium, 2007 Joint with the 21st European Frequency and Time Forum. IEEE International
  • Conference_Location
    Geneva
  • ISSN
    1075-6787
  • Print_ISBN
    978-1-4244-0646-3
  • Electronic_ISBN
    1075-6787
  • Type

    conf

  • DOI
    10.1109/FREQ.2007.4319181
  • Filename
    4319181